TEST_NAME : Wafer
TEST_DATE : 24_09_03-14_28_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-012-016-07 | FUSED_ID : 6359364768392855815
  IC_TEMP :  -55.39 | VDDM : 1149.05 | AUX_INT : -223.20 | CsaBias :  -94.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.36357e-04 / 2
  ADC_P0  : -2.23204e-01 ± 2.48858e-02
  ADC_P1  : 1.19229e-02 ± 5.71809e-04
  ADC_P2  : -1.84965e-05 ± 2.58129e-06
  CSA_Chi2/NDF : 1.37883e-04 / 2
  CSA_P0  : 6.03219e-02 ± 7.83210e-03
  CSA_P1  : 1.02304e-02 ± 5.90092e-04
  CSA_P2  : -5.01852e-05 ± 8.98640e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [18, 54, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [27, 41, 53, 56, 66, 67, 107, 110, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3603', '1.800', '0.1675', '1.800', '0.0876', '7.000', '0.7087', 1, 1, 1, 1, 1725366506.109616]
VI_after__Init : ['1.201', '0.3602', '1.800', '0.1675', '1.800', '0.0804', '7.000', '0.7076', 1, 1, 1, 1, 1725366514.2441282]
VI_at__the_End : ['1.202', '0.5045', '1.800', '0.1377', '1.800', '0.1094', '6.999', '0.7083', 1, 1, 1, 1, 1725366573.3915756]