TEST_NAME : Wafer
TEST_DATE : 24_09_03-14_38_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-012-022-07 | FUSED_ID : 6359364768392855911
  IC_TEMP :  -55.49 | VDDM : 1134.82 | AUX_INT :   -7.94 | CsaBias :   68.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13228e-03 / 2
  ADC_P0  : -7.94320e-03 ± 2.27661e-02
  ADC_P1  : 8.54050e-03 ± 5.64838e-04
  ADC_P2  : -6.44079e-06 ± 2.76912e-06
  CSA_Chi2/NDF : 9.57094e-05 / 2
  CSA_P0  : 6.07647e-02 ± 6.52529e-03
  CSA_P1  : 9.81276e-03 ± 4.91633e-04
  CSA_P2  : -4.41218e-05 ± 7.48699e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [0, 9, 79, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 13, 14, 16, 20, 52, 84, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3486', '1.800', '0.1418', '1.800', '0.0878', '7.000', '0.7070', 1, 1, 1, 1, 1725367084.6394017]
VI_after__Init : ['1.202', '0.3485', '1.800', '0.1418', '1.800', '0.0821', '7.000', '0.7070', 1, 1, 1, 1, 1725367092.720765]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1390', '1.800', '0.1101', '7.000', '0.7078', 1, 1, 1, 1, 1725367161.664379]