TEST_NAME : Wafer
TEST_DATE : 24_09_03-14_39_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-012-023-07 | FUSED_ID : 6359364768392855927
  IC_TEMP :  -49.67 | VDDM : 1125.32 | AUX_INT :   -8.10 | CsaBias :   76.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01269e-03 / 2
  ADC_P0  : -8.10324e-03 ± 2.14802e-02
  ADC_P1  : 8.54738e-03 ± 5.25359e-04
  ADC_P2  : -6.89558e-06 ± 2.53977e-06
  CSA_Chi2/NDF : 9.83272e-05 / 2
  CSA_P0  : 5.78844e-02 ± 6.61392e-03
  CSA_P1  : 9.74435e-03 ± 4.98311e-04
  CSA_P2  : -4.26287e-05 ± 7.58869e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 18, 23, 99, 111, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 32, 39, 100, 116, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3347', '1.800', '0.1527', '1.800', '0.0884', '7.000', '0.7072', 1, 1, 1, 1, 1725367180.4439201]
VI_after__Init : ['1.202', '0.3348', '1.800', '0.1527', '1.800', '0.0830', '7.000', '0.7071', 1, 1, 1, 1, 1725367189.2271783]
VI_at__the_End : ['1.201', '0.4995', '1.800', '0.1366', '1.803', '0.1107', '7.000', '0.7077', 1, 1, 1, 1, 1725367258.9548047]