TEST_NAME : Wafer
TEST_DATE : 24_09_03-14_41_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-012-024-07 | FUSED_ID : 6359364768392855943
  IC_TEMP :  -54.98 | VDDM : 1127.55 | AUX_INT :   -8.41 | CsaBias :   73.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22380e-03 / 2
  ADC_P0  : -8.41483e-03 ± 2.36956e-02
  ADC_P1  : 8.26656e-03 ± 5.71057e-04
  ADC_P2  : -5.78014e-06 ± 2.72959e-06
  CSA_Chi2/NDF : 1.27220e-04 / 2
  CSA_P0  : 5.67341e-02 ± 7.52316e-03
  CSA_P1  : 9.82277e-03 ± 5.66815e-04
  CSA_P2  : -4.57289e-05 ± 8.63193e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 14, 33, 38, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [37, 50, 52, 54, 84, 90, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4123', '1.800', '0.1411', '1.800', '0.0917', '7.000', '0.7069', 1, 1, 1, 1, 1725367277.6942792]
VI_after__Init : ['1.202', '0.4121', '1.800', '0.1411', '1.800', '0.0860', '7.000', '0.7071', 1, 1, 1, 1, 1725367285.8296192]
VI_at__the_End : ['1.202', '0.4911', '1.800', '0.1338', '1.802', '0.1111', '7.003', '0.7079', 1, 1, 1, 1, 1725367355.3920975]