TEST_NAME : Wafer
TEST_DATE : 24_09_03-14_44_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-012-026-07 | FUSED_ID : 6359364768392855975
  IC_TEMP :  -47.43 | VDDM : 1126.89 | AUX_INT :   -8.23 | CsaBias :   85.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25582e-03 / 2
  ADC_P0  : -8.22903e-03 ± 2.40705e-02
  ADC_P1  : 7.89135e-03 ± 5.71672e-04
  ADC_P2  : -4.21193e-06 ± 2.70460e-06
  CSA_Chi2/NDF : 7.50099e-05 / 2
  CSA_P0  : 5.78725e-02 ± 5.77673e-03
  CSA_P1  : 9.46208e-03 ± 4.35235e-04
  CSA_P2  : -3.85057e-05 ± 6.62811e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [18, 20, 42, 48, 67, 68, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 10, 33, 54, 78, 92, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2065', '1.800', '0.1491', '1.800', '0.0867', '7.000', '0.7072', 1, 1, 1, 1, 1725367470.6271808]
VI_after__Init : ['1.202', '0.2065', '1.800', '0.1491', '1.800', '0.0810', '7.000', '0.7067', 1, 1, 1, 1, 1725367478.7135885]
VI_at__the_End : ['1.202', '0.4982', '1.800', '0.1379', '1.800', '0.1086', '7.000', '0.7076', 1, 1, 1, 1, 1725367539.2199318]