TEST_NAME : Wafer
TEST_DATE : 24_09_03-14_58_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-013-019-10 | FUSED_ID : 6359364768392859962
  IC_TEMP :  -59.17 | VDDM : 1206.45 | AUX_INT : -832.61 | CsaBias : -587.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.13909e-02 / 2
  ADC_P0  : -8.32615e-01 ± 3.48473e-01
  ADC_P1  : 2.09892e-02 ± 6.80017e-03
  ADC_P2  : -4.98306e-05 ± 2.72282e-05
  CSA_Chi2/NDF : 7.49014e-05 / 2
  CSA_P0  : 5.99437e-02 ± 5.77255e-03
  CSA_P1  : 9.54257e-03 ± 4.34920e-04
  CSA_P2  : -3.99295e-05 ± 6.62331e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [10, 21, 26, 55, 78, 95, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [48, 67, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1730', '1.800', '0.1554', '1.800', '0.0821', '7.000', '0.7081', 1, 1, 1, 1, 1725368333.1144078]
VI_after__Init : ['1.202', '0.1731', '1.800', '0.1554', '1.799', '0.0745', '7.000', '0.7071', 1, 1, 1, 1, 1725368341.3037758]
VI_at__the_End : ['1.201', '0.4997', '1.800', '0.1367', '1.799', '0.1096', '7.000', '0.7078', 1, 1, 1, 1, 1725368403.4429946]