TEST_NAME : Wafer
TEST_DATE : 24_09_03-15_53_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-014-020-04 | FUSED_ID : 6359364768392864068
  IC_TEMP :  -57.05 | VDDM : 1115.59 | AUX_INT :   -9.85 | CsaBias :   55.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65590e-03 / 2
  ADC_P0  : -9.85470e-03 ± 2.76306e-02
  ADC_P1  : 8.17736e-03 ± 6.64682e-04
  ADC_P2  : -5.08649e-06 ± 3.19270e-06
  CSA_Chi2/NDF : 1.34989e-04 / 2
  CSA_P0  : 5.89410e-02 ± 7.74945e-03
  CSA_P1  : 9.83913e-03 ± 5.83865e-04
  CSA_P2  : -4.97321e-05 ± 8.89158e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [7, 8, 48, 52, 58, 61, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 17, 27, 60, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3550', '1.800', '0.1453', '1.800', '0.0972', '7.000', '0.7076', 1, 1, 1, 1, 1725371612.997667]
VI_after__Init : ['1.201', '0.3547', '1.800', '0.1452', '1.800', '0.0917', '7.000', '0.7074', 1, 1, 1, 1, 1725371621.11615]
VI_at__the_End : ['1.202', '0.4784', '1.800', '0.1347', '1.800', '0.1118', '7.000', '0.7083', 1, 1, 1, 1, 1725371688.6450636]