TEST_NAME : Wafer
TEST_DATE : 24_09_03-15_55_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-014-021-04 | FUSED_ID : 6359364768392864084
  IC_TEMP :  -55.84 | VDDM : 1118.12 | AUX_INT :   -7.56 | CsaBias :   69.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49734e-03 / 2
  ADC_P0  : -7.55963e-03 ± 2.63030e-02
  ADC_P1  : 7.78736e-03 ± 6.15669e-04
  ADC_P2  : -4.19488e-06 ± 2.86675e-06
  CSA_Chi2/NDF : 1.30456e-04 / 2
  CSA_P0  : 5.80860e-02 ± 7.61825e-03
  CSA_P1  : 9.68716e-03 ± 5.73980e-04
  CSA_P2  : -4.76087e-05 ± 8.74103e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 51, 66, 99, 120, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [5, 8, 25, 28, 54, 97, 99, 100, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2939', '1.800', '0.1384', '1.800', '0.0817', '7.000', '0.7076', 1, 1, 1, 1, 1725371708.8165545]
VI_after__Init : ['1.202', '0.2903', '1.800', '0.1377', '1.800', '0.0771', '7.000', '0.7076', 1, 1, 1, 1, 1725371716.782933]
VI_at__the_End : ['1.202', '0.4754', '1.800', '0.1325', '1.800', '0.1109', '7.000', '0.7082', 1, 1, 1, 1, 1725371785.0157928]