TEST_NAME : Wafer
TEST_DATE : 24_09_03-15_58_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-014-023-04 | FUSED_ID : 6359364768392864116
  IC_TEMP :  -56.48 | VDDM : 1150.45 | AUX_INT : -297.01 | CsaBias : -170.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.48560e-04 / 2
  ADC_P0  : -2.97009e-01 ± 2.81445e-02
  ADC_P1  : 1.29011e-02 ± 6.29656e-04
  ADC_P2  : -2.16759e-05 ± 2.78665e-06
  CSA_Chi2/NDF : 1.33307e-04 / 2
  CSA_P0  : 5.93657e-02 ± 7.70103e-03
  CSA_P1  : 1.00418e-02 ± 5.80217e-04
  CSA_P2  : -4.82017e-05 ± 8.83602e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [36, 53, 65, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 58, 66, 76, 90, 100, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3928', '1.800', '0.1514', '1.800', '0.0904', '7.000', '0.7077', 1, 1, 1, 1, 1725371902.1029823]
VI_after__Init : ['1.201', '0.3917', '1.800', '0.1519', '1.800', '0.0850', '7.000', '0.7076', 1, 1, 1, 1, 1725371910.3104541]
VI_at__the_End : ['1.201', '0.4934', '1.800', '0.1391', '1.806', '0.1100', '7.000', '0.7084', 1, 1, 1, 1, 1725371977.866352]