TEST_NAME : Wafer
TEST_DATE : 24_09_03-16_01_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-014-025-04 | FUSED_ID : 6359364768392864148
  IC_TEMP :  -57.53 | VDDM : 1120.66 | AUX_INT :   -9.24 | CsaBias :   73.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49164e-03 / 2
  ADC_P0  : -9.23636e-03 ± 2.61798e-02
  ADC_P1  : 8.34311e-03 ± 6.33073e-04
  ADC_P2  : -5.98387e-06 ± 3.03985e-06
  CSA_Chi2/NDF : 1.22994e-04 / 2
  CSA_P0  : 5.70723e-02 ± 7.39714e-03
  CSA_P1  : 9.44019e-03 ± 5.57321e-04
  CSA_P2  : -4.32612e-05 ± 8.48734e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [10, 42, 50, 67, 70, 81, 95, 113, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [6, 23, 52, 58, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4657', '1.800', '0.1505', '1.800', '0.0972', '7.000', '0.7081', 1, 1, 1, 1, 1725372095.1684995]
VI_after__Init : ['1.201', '0.4552', '1.800', '0.1492', '1.800', '0.0950', '7.000', '0.7077', 1, 1, 1, 1, 1725372103.2959833]
VI_at__the_End : ['1.202', '0.4740', '1.800', '0.1298', '1.800', '0.1120', '7.000', '0.7086', 1, 1, 1, 1, 1725372170.863839]