TEST_NAME : Wafer
TEST_DATE : 24_09_03-16_03_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-014-026-04 | FUSED_ID : 6359364768392864164
  IC_TEMP :  -52.01 | VDDM : 1115.20 | AUX_INT :   -5.03 | CsaBias :   83.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.92325e-04 / 2
  ADC_P0  : -5.02981e-03 ± 1.90812e-02
  ADC_P1  : 8.12840e-03 ± 4.72165e-04
  ADC_P2  : -4.69986e-06 ± 2.29990e-06
  CSA_Chi2/NDF : 8.47298e-05 / 2
  CSA_P0  : 5.67566e-02 ± 6.13960e-03
  CSA_P1  : 9.12364e-03 ± 4.62575e-04
  CSA_P2  : -3.53027e-05 ± 7.04447e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [24, 30, 59, 61, 62, 67, 80, 96, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [9, 46, 65, 70, 74, 101, 106, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3000', '1.800', '0.1247', '1.800', '0.0901', '7.000', '0.7076', 1, 1, 1, 1, 1725372191.2023811]
VI_after__Init : ['1.201', '0.2995', '1.800', '0.1245', '1.800', '0.0852', '7.000', '0.7075', 1, 1, 1, 1, 1725372199.2496786]
VI_at__the_End : ['1.201', '0.4903', '1.800', '0.1326', '1.800', '0.1079', '7.000', '0.7084', 1, 1, 1, 1, 1725372267.5405831]