TEST_NAME : Wafer
TEST_DATE : 24_09_03-16_25_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-015-012-14 | FUSED_ID : 6359364768392868046
  IC_TEMP :  -45.27 | VDDM : 1127.72 | AUX_INT :   -7.79 | CsaBias :   89.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03439e-03 / 2
  ADC_P0  : -7.79463e-03 ± 2.17687e-02
  ADC_P1  : 8.18500e-03 ± 5.22864e-04
  ADC_P2  : -5.54262e-06 ± 2.48792e-06
  CSA_Chi2/NDF : 9.62976e-05 / 2
  CSA_P0  : 5.94765e-02 ± 6.54531e-03
  CSA_P1  : 9.45807e-03 ± 4.93142e-04
  CSA_P2  : -3.81194e-05 ± 7.50996e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [39, 89, 97, 115, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [37, 58, 82, 85, 107, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2414', '1.800', '0.1490', '1.799', '0.0919', '7.000', '0.7069', 1, 1, 1, 1, 1725373540.3268592]
VI_after__Init : ['1.202', '0.2414', '1.800', '0.1491', '1.800', '0.0864', '7.000', '0.7069', 1, 1, 1, 1, 1725373548.4372344]
VI_at__the_End : ['1.194', '0.5011', '1.800', '0.1384', '1.800', '0.1092', '7.000', '0.7077', 1, 1, 1, 1, 1725373610.0054226]