TEST_NAME : Wafer
TEST_DATE : 24_09_03-16_24_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-015-013-14 | FUSED_ID : 6359364768392868062
  IC_TEMP :  -56.91 | VDDM : 1135.92 | AUX_INT :   -8.23 | CsaBias :   67.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09595e-03 / 2
  ADC_P0  : -8.22826e-03 ± 2.24120e-02
  ADC_P1  : 8.51267e-03 ± 5.59698e-04
  ADC_P2  : -5.90023e-06 ± 2.77514e-06
  CSA_Chi2/NDF : 1.42340e-04 / 2
  CSA_P0  : 6.18528e-02 ± 7.95767e-03
  CSA_P1  : 1.03972e-02 ± 5.99553e-04
  CSA_P2  : -5.19422e-05 ± 9.13048e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [7, 25, 31, 40, 70, 90, 92, 98, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [25, 41, 102, 103, 104, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4151', '1.800', '0.1697', '1.800', '0.0971', '7.000', '0.7069', 1, 1, 1, 1, 1725373444.1893432]
VI_after__Init : ['1.202', '0.4152', '1.800', '0.1697', '1.800', '0.0914', '7.000', '0.7067', 1, 1, 1, 1, 1725373452.2546754]
VI_at__the_End : ['1.202', '0.5064', '1.800', '0.1416', '1.800', '0.1110', '7.000', '0.7076', 1, 1, 1, 1, 1725373513.5978882]