TEST_NAME : Wafer
TEST_DATE : 24_09_03-16_08_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-015-023-09 | FUSED_ID : 6359364768392868217
  IC_TEMP :  -43.46 | VDDM : 1103.94 | AUX_INT :   -7.14 | CsaBias :   91.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12726e-03 / 2
  ADC_P0  : -7.14297e-03 ± 2.28285e-02
  ADC_P1  : 7.66832e-03 ± 5.37092e-04
  ADC_P2  : -3.50004e-06 ± 2.51427e-06
  CSA_Chi2/NDF : 8.96613e-05 / 2
  CSA_P0  : 5.71995e-02 ± 6.31575e-03
  CSA_P1  : 9.27078e-03 ± 4.75846e-04
  CSA_P2  : -3.61381e-05 ± 7.24657e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 20, 55, 72, 75, 81, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [18, 38, 68, 99, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3457', '1.800', '0.1069', '1.800', '0.0885', '7.000', '0.7075', 1, 1, 1, 1, 1725372479.718529]
VI_after__Init : ['1.201', '0.3459', '1.800', '0.1069', '1.800', '0.0828', '7.000', '0.7074', 1, 1, 1, 1, 1725372487.9069111]
VI_at__the_End : ['1.201', '0.4960', '1.800', '0.1343', '1.799', '0.1080', '7.000', '0.7080', 1, 1, 1, 1, 1725372552.1590421]