TEST_NAME : Wafer
TEST_DATE : 24_09_03-16_06_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-015-024-09 | FUSED_ID : 6359364768392868233
  IC_TEMP :  -48.45 | VDDM : 1123.35 | AUX_INT :   -7.41 | CsaBias :   86.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.61043e-04 / 2
  ADC_P0  : -7.41351e-03 ± 2.09845e-02
  ADC_P1  : 7.86443e-03 ± 4.86974e-04
  ADC_P2  : -4.98228e-06 ± 2.23904e-06
  CSA_Chi2/NDF : 7.70138e-05 / 2
  CSA_P0  : 5.83756e-02 ± 5.85338e-03
  CSA_P1  : 9.42420e-03 ± 4.41010e-04
  CSA_P2  : -3.74456e-05 ± 6.71606e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [13, 27, 53, 90, 98, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [14, 17, 31, 55, 59, 72, 79, 91, 94, 96, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4254', '1.800', '0.1609', '1.799', '0.0990', '7.000', '0.7076', 1, 1, 1, 1, 1725372384.0319128]
VI_after__Init : ['1.201', '0.4255', '1.800', '0.1609', '1.800', '0.0934', '7.000', '0.7074', 1, 1, 1, 1, 1725372392.0641294]
VI_at__the_End : ['1.201', '0.5002', '1.800', '0.1325', '1.802', '0.1080', '7.000', '0.7083', 1, 1, 1, 1, 1725372452.880515]