TEST_NAME : Wafer
TEST_DATE : 24_09_03-16_04_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-015-025-09 | FUSED_ID : 6359364768392868249
  IC_TEMP :  -55.94 | VDDM : 1190.84 | AUX_INT : -881.62 | CsaBias : -612.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.19918e-02 / 2
  ADC_P0  : -8.81622e-01 ± 3.58948e-01
  ADC_P1  : 2.13882e-02 ± 6.80122e-03
  ADC_P2  : -5.07501e-05 ± 2.64879e-05
  CSA_Chi2/NDF : 6.47128e-05 / 2
  CSA_P0  : 5.72990e-02 ± 5.36559e-03
  CSA_P1  : 9.17045e-03 ± 4.04258e-04
  CSA_P2  : -3.35625e-05 ± 6.15638e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 12, 31, 61, 70, 110, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 14, 51, 78, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1856', '1.800', '0.1146', '1.800', '0.0886', '7.000', '0.7075', 1, 1, 1, 1, 1725372287.6940722]
VI_after__Init : ['1.202', '0.1856', '1.800', '0.1146', '1.800', '0.0828', '7.000', '0.7074', 1, 1, 1, 1, 1725372296.4643757]
VI_at__the_End : ['1.201', '0.4987', '1.800', '0.1338', '1.800', '0.1081', '7.000', '0.7084', 1, 1, 1, 1, 1725372359.5386145]