TEST_NAME : Wafer
TEST_DATE : 24_09_03-17_32_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-017-007-11 | FUSED_ID : 6359364768392876155
  IC_TEMP :  -35.81 | VDDM : 1197.31 | AUX_INT : -1223.39 | CsaBias : -785.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.15153e-02 / 2
  ADC_P0  : -1.22339e+00 ± 6.09193e-01
  ADC_P1  : 2.54504e-02 ± 1.05501e-02
  ADC_P2  : -6.23791e-05 ± 3.84206e-05
  CSA_Chi2/NDF : 7.68587e-05 / 2
  CSA_P0  : 5.59778e-02 ± 5.84748e-03
  CSA_P1  : 9.17673e-03 ± 4.40566e-04
  CSA_P2  : -3.45014e-05 ± 6.70929e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [13, 22, 26, 29, 66, 98, 101, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 58, 61, 78, 116, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1932', '1.800', '0.1173', '1.799', '0.0828', '7.000', '0.7072', 1, 1, 1, 1, 1725377576.2118044]
VI_after__Init : ['1.202', '0.1932', '1.800', '0.1172', '1.800', '0.0775', '7.000', '0.7074', 1, 1, 1, 1, 1725377584.4340856]
VI_at__the_End : ['1.202', '0.4942', '1.800', '0.1324', '1.801', '0.1093', '7.000', '0.7083', 1, 1, 1, 1, 1725377648.076511]