TEST_NAME : Wafer
TEST_DATE : 24_09_03-17_16_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-017-017-12 | FUSED_ID : 6359364768392876316
  IC_TEMP :  -49.54 | VDDM : 1119.27 | AUX_INT :  -19.24 | CsaBias :   63.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92194e-03 / 2
  ADC_P0  : -1.92412e-02 ± 3.02275e-02
  ADC_P1  : 8.32511e-03 ± 7.09141e-04
  ADC_P2  : -6.32188e-06 ± 3.30835e-06
  CSA_Chi2/NDF : 1.15411e-04 / 2
  CSA_P0  : 5.76290e-02 ± 7.16549e-03
  CSA_P1  : 9.55665e-03 ± 5.39868e-04
  CSA_P2  : -4.07986e-05 ± 8.22155e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [15, 36, 50, 68, 77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [8, 86, 111, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4393', '1.800', '0.1559', '1.799', '0.0877', '7.000', '0.7067', 1, 1, 1, 1, 1725376612.0492296]
VI_after__Init : ['1.201', '0.4373', '1.800', '0.1557', '1.800', '0.0831', '7.000', '0.7066', 1, 1, 1, 1, 1725376620.8424878]
VI_at__the_End : ['1.202', '0.4940', '1.800', '0.1354', '1.800', '0.1105', '7.000', '0.7077', 1, 1, 1, 1, 1725376679.3430874]