TEST_NAME : Wafer
TEST_DATE : 24_09_03-17_15_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-017-018-12 | FUSED_ID : 6359364768392876332
  IC_TEMP :  -51.44 | VDDM : 1128.44 | AUX_INT :   -7.89 | CsaBias :   70.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10709e-03 / 2
  ADC_P0  : -7.88984e-03 ± 2.25615e-02
  ADC_P1  : 7.88184e-03 ± 5.29624e-04
  ADC_P2  : -4.62344e-06 ± 2.46988e-06
  CSA_Chi2/NDF : 1.14011e-04 / 2
  CSA_P0  : 5.81830e-02 ± 7.12191e-03
  CSA_P1  : 9.64448e-03 ± 5.36585e-04
  CSA_P2  : -4.20081e-05 ± 8.17155e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [34, 35, 52, 56, 101, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [5, 30, 38, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2468', '1.800', '0.1283', '1.800', '0.0870', '7.000', '0.7068', 1, 1, 1, 1, 1725376514.9986343]
VI_after__Init : ['1.201', '0.2469', '1.800', '0.1283', '1.800', '0.0813', '7.000', '0.7067', 1, 1, 1, 1, 1725376523.8040154]
VI_at__the_End : ['1.202', '0.4981', '1.800', '0.1365', '1.799', '0.1110', '7.000', '0.7079', 1, 1, 1, 1, 1725376588.2459543]