TEST_NAME : Wafer
TEST_DATE : 24_09_03-17_13_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-017-019-12 | FUSED_ID : 6359364768392876348
  IC_TEMP :  -51.55 | VDDM : 1126.16 | AUX_INT :   -8.21 | CsaBias :   79.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17276e-03 / 2
  ADC_P0  : -8.21277e-03 ± 2.32123e-02
  ADC_P1  : 8.05596e-03 ± 5.52925e-04
  ADC_P2  : -5.02768e-06 ± 2.61745e-06
  CSA_Chi2/NDF : 1.00343e-04 / 2
  CSA_P0  : 5.80594e-02 ± 6.68138e-03
  CSA_P1  : 9.44184e-03 ± 5.03394e-04
  CSA_P2  : -3.94744e-05 ± 7.66609e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [12, 69, 70, 92, 98, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [22, 32, 58, 73, 76, 80, 111, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1177', '1.800', '0.1558', '1.800', '0.0825', '7.000', '0.7079', 1, 1, 1, 1, 1725376417.990203]
VI_after__Init : ['1.202', '0.1177', '1.800', '0.1557', '1.800', '0.0753', '7.000', '0.7068', 1, 1, 1, 1, 1725376426.2295434]
VI_at__the_End : ['1.201', '0.4927', '1.800', '0.1343', '1.804', '0.1113', '7.000', '0.7077', 1, 1, 1, 1, 1725376486.2388217]