TEST_NAME : Wafer
TEST_DATE : 24_09_03-17_10_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-017-021-12 | FUSED_ID : 6359364768392876380
  IC_TEMP :  -52.24 | VDDM : 1130.22 | AUX_INT :   -5.73 | CsaBias :   74.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.13280e-04 / 2
  ADC_P0  : -5.73334e-03 ± 1.80332e-02
  ADC_P1  : 8.07501e-03 ± 4.26264e-04
  ADC_P2  : -5.85327e-06 ± 1.97798e-06
  CSA_Chi2/NDF : 7.70439e-05 / 2
  CSA_P0  : 5.87752e-02 ± 5.85452e-03
  CSA_P1  : 9.29620e-03 ± 4.41096e-04
  CSA_P2  : -3.56906e-05 ± 6.71737e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [22, 27, 45, 46, 47, 49, 55, 57, 75, 87, 90, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 58, 63, 85, 103, 110, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3503', '1.800', '0.1307', '1.800', '0.0963', '7.000', '0.7073', 1, 1, 1, 1, 1725376224.9760957]
VI_after__Init : ['1.202', '0.3505', '1.800', '0.1301', '1.800', '0.0908', '7.000', '0.7074', 1, 1, 1, 1, 1725376233.7933376]
VI_at__the_End : ['1.201', '0.4982', '1.800', '0.1353', '1.800', '0.1097', '7.000', '0.7078', 1, 1, 1, 1, 1725376295.9895594]