TEST_NAME : Wafer
TEST_DATE : 24_09_03-17_40_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-018-013-05 | FUSED_ID : 6359364768392880341
  IC_TEMP :  -51.92 | VDDM : 1125.95 | AUX_INT :  -10.22 | CsaBias :   74.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63833e-03 / 2
  ADC_P0  : -1.02184e-02 ± 2.74431e-02
  ADC_P1  : 8.50886e-03 ± 6.78056e-04
  ADC_P2  : -5.92992e-06 ± 3.34379e-06
  CSA_Chi2/NDF : 1.55094e-04 / 2
  CSA_P0  : 5.95350e-02 ± 8.30653e-03
  CSA_P1  : 1.02576e-02 ± 6.25837e-04
  CSA_P2  : -4.78393e-05 ± 9.53076e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [67, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 36, 59, 65, 80, 92, 105, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1979', '1.800', '0.1317', '1.800', '0.0849', '7.000', '0.7078', 1, 1, 1, 1, 1725378058.5050972]
VI_after__Init : ['1.202', '0.1979', '1.800', '0.1317', '1.802', '0.0794', '7.000', '0.7077', 1, 1, 1, 1, 1725378066.5475092]
VI_at__the_End : ['1.202', '0.5116', '1.800', '0.1405', '1.800', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1725378126.8660703]