TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_03_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-002-010-11 | FUSED_ID : 6359364768394911915
  IC_TEMP :  -90.39 | VDDM : 1105.80 | AUX_INT :  -10.77 | CsaBias :   43.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.97381e-03 / 2
  ADC_P0  : -1.07687e-02 ± 3.01904e-02
  ADC_P1  : 9.05832e-03 ± 8.01233e-04
  ADC_P2  : -6.23709e-06 ± 4.25667e-06
  CSA_Chi2/NDF : 1.50973e-04 / 2
  CSA_P0  : 5.92727e-02 ± 8.19542e-03
  CSA_P1  : 1.05800e-02 ± 6.17466e-04
  CSA_P2  : -7.23789e-05 ± 9.40328e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  
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VI_before_Init : ['1.201', '0.2897', '1.800', '0.1105', '1.801', '0.1118', '6.999', '0.7089', 1, 1, 1, 1, 1725516216.9394495]
VI_after__Init : ['1.201', '0.2896', '1.800', '0.1105', '1.804', '0.1044', '7.000', '0.7076', 1, 1, 1, 1, 1725516225.0717454]
VI_at__the_End : ['1.201', '0.4320', '1.800', '0.1353', '1.804', '0.1209', '7.000', '0.7087', 1, 1, 1, 1, 1725516292.3467011]