TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_05_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-002-011-11 | FUSED_ID : 6359364768394911931
  IC_TEMP :  -73.28 | VDDM : 1113.06 | AUX_INT :  -12.59 | CsaBias :   57.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.46843e-03 / 2
  ADC_P0  : -1.25872e-02 ± 3.37342e-02
  ADC_P1  : 8.87317e-03 ± 8.55289e-04
  ADC_P2  : -6.66228e-06 ± 4.35136e-06
  CSA_Chi2/NDF : 2.26524e-04 / 2
  CSA_P0  : 5.88388e-02 ± 1.00387e-02
  CSA_P1  : 1.04901e-02 ± 7.56347e-04
  CSA_P2  : -6.24686e-05 ± 1.15183e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [6, 23, 27, 30, 34, 43, 55, 56, 80, 96, 104, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [105, 112, 117, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2758', '1.800', '0.1895', '1.799', '0.1003', '7.000', '0.7079', 1, 1, 1, 1, 1725516344.3928049]
VI_after__Init : ['1.201', '0.2759', '1.800', '0.1896', '1.799', '0.0947', '7.000', '0.7077', 1, 1, 1, 1, 1725516352.4831893]
VI_at__the_End : ['1.201', '0.4659', '1.800', '0.1377', '1.800', '0.1207', '7.000', '0.7087', 1, 1, 1, 1, 1725516414.3855243]