TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_12_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-002-015-11 | FUSED_ID : 6359364768394911995
  IC_TEMP :  -61.01 | VDDM : 1121.42 | AUX_INT :   -7.62 | CsaBias :   67.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46865e-03 / 2
  ADC_P0  : -7.62375e-03 ± 2.60063e-02
  ADC_P1  : 8.42798e-03 ± 6.45383e-04
  ADC_P2  : -5.70797e-06 ± 3.17677e-06
  CSA_Chi2/NDF : 1.66943e-04 / 2
  CSA_P0  : 5.82936e-02 ± 8.61800e-03
  CSA_P1  : 1.00300e-02 ± 6.49304e-04
  CSA_P2  : -5.22884e-05 ± 9.88813e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [17, 32, 50, 62, 86, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [4, 57, 62, 65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2464', '1.800', '0.1730', '1.800', '0.0891', '7.000', '0.7079', 1, 1, 1, 1, 1725516731.4942677]
VI_after__Init : ['1.200', '0.2462', '1.800', '0.1730', '1.800', '0.0834', '7.000', '0.7078', 1, 1, 1, 1, 1725516740.109527]
VI_at__the_End : ['1.202', '0.4782', '1.800', '0.1356', '1.804', '0.1175', '7.000', '0.7083', 1, 1, 1, 1, 1725516809.6068997]