TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_13_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-002-016-12 | FUSED_ID : 6359364768394912012
  IC_TEMP :  -65.89 | VDDM : 1125.10 | AUX_INT :   -9.82 | CsaBias :   68.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.91991e-03 / 2
  ADC_P0  : -9.81908e-03 ± 2.97416e-02
  ADC_P1  : 8.73644e-03 ± 7.53106e-04
  ADC_P2  : -6.27167e-06 ± 3.80974e-06
  CSA_Chi2/NDF : 1.89507e-04 / 2
  CSA_P0  : 5.84245e-02 ± 9.18196e-03
  CSA_P1  : 1.11833e-02 ± 6.91795e-04
  CSA_P2  : -6.88417e-05 ± 1.05352e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 77, 95, 116, 118, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [2, 15, 67, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1760', '1.800', '0.1250', '1.799', '0.0853', '7.003', '0.7077', 1, 1, 1, 1, 1725516827.366535]
VI_after__Init : ['1.202', '0.1760', '1.800', '0.1250', '1.799', '0.0795', '7.000', '0.7076', 1, 1, 1, 1, 1725516835.8948848]
VI_at__the_End : ['1.202', '0.4738', '1.800', '0.1394', '1.799', '0.1191', '7.000', '0.7086', 1, 1, 1, 1, 1725516905.3952324]