TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_17_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-002-018-12 | FUSED_ID : 6359364768394912044
  IC_TEMP :  -62.21 | VDDM : 1122.35 | AUX_INT :   -9.85 | CsaBias :   57.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57450e-03 / 2
  ADC_P0  : -9.85329e-03 ± 2.68948e-02
  ADC_P1  : 8.52782e-03 ± 6.62371e-04
  ADC_P2  : -6.23574e-06 ± 3.24806e-06
  CSA_Chi2/NDF : 1.63336e-04 / 2
  CSA_P0  : 5.76163e-02 ± 8.52438e-03
  CSA_P1  : 1.01081e-02 ± 6.42250e-04
  CSA_P2  : -5.38956e-05 ± 9.78071e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [6, 11, 17, 21, 26, 28, 32, 58, 61, 82, 84, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [3, 20, 29, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2804', '1.800', '0.1273', '1.800', '0.0954', '7.000', '0.7076', 1, 1, 1, 1, 1725517021.0190244]
VI_after__Init : ['1.200', '0.2799', '1.800', '0.1274', '1.800', '0.0896', '7.000', '0.7075', 1, 1, 1, 1, 1725517029.538443]
VI_at__the_End : ['1.202', '0.4735', '1.800', '0.1343', '1.805', '0.1195', '7.000', '0.7083', 1, 1, 1, 1, 1725517097.5909753]