TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_39_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-003-010-06 | FUSED_ID : 6359364768394916006
  IC_TEMP :  -61.49 | VDDM : 1124.86 | AUX_INT :   -8.77 | CsaBias :   66.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46236e-03 / 2
  ADC_P0  : -8.77076e-03 ± 2.59585e-02
  ADC_P1  : 8.41771e-03 ± 6.46320e-04
  ADC_P2  : -5.43256e-06 ± 3.19954e-06
  CSA_Chi2/NDF : 2.00471e-04 / 2
  CSA_P0  : 5.97701e-02 ± 9.44383e-03
  CSA_P1  : 1.03025e-02 ± 7.11524e-04
  CSA_P2  : -5.56659e-05 ± 1.08357e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [12, 72, 93, 109, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 62, 87, 93, 98, 104, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2596', '1.800', '0.1598', '1.800', '0.0964', '7.000', '0.7072', 1, 1, 1, 1, 1725518375.4764829]
VI_after__Init : ['1.202', '0.2597', '1.800', '0.1599', '1.799', '0.0904', '7.000', '0.7069', 1, 1, 1, 1, 1725518383.61977]
VI_at__the_End : ['1.202', '0.4850', '1.800', '0.1405', '1.804', '0.1198', '7.000', '0.7079', 1, 1, 1, 1, 1725518442.47528]