TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_34_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-003-013-06 | FUSED_ID : 6359364768394916054
  IC_TEMP :  -63.16 | VDDM : 1118.63 | AUX_INT :   -8.97 | CsaBias :   59.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60151e-03 / 2
  ADC_P0  : -8.97239e-03 ± 2.71429e-02
  ADC_P1  : 8.65261e-03 ± 6.84862e-04
  ADC_P2  : -6.04160e-06 ± 3.44790e-06
  CSA_Chi2/NDF : 2.05492e-04 / 2
  CSA_P0  : 5.90414e-02 ± 9.56136e-03
  CSA_P1  : 1.05010e-02 ± 7.20379e-04
  CSA_P2  : -6.07388e-05 ± 1.09705e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [3, 6, 7, 19, 21, 28, 41, 50, 76, 98, 102, 118, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [31, 34, 42, 50, 95, 100, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1745', '1.800', '0.1325', '1.800', '0.0871', '7.000', '0.7069', 1, 1, 1, 1, 1725518084.6586087]
VI_after__Init : ['1.202', '0.1745', '1.800', '0.1325', '1.800', '0.0817', '7.000', '0.7065', 1, 1, 1, 1, 1725518092.667072]
VI_at__the_End : ['1.202', '0.4746', '1.800', '0.1344', '1.800', '0.1203', '7.000', '0.7074', 1, 1, 1, 1, 1725518148.2318008]