TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_31_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-003-015-06 | FUSED_ID : 6359364768394916086
  IC_TEMP :  -55.62 | VDDM : 1117.03 | AUX_INT :   -9.32 | CsaBias :   59.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39247e-03 / 2
  ADC_P0  : -9.31945e-03 ± 2.52546e-02
  ADC_P1  : 8.66341e-03 ± 6.27364e-04
  ADC_P2  : -6.81080e-06 ± 3.09283e-06
  CSA_Chi2/NDF : 1.28321e-04 / 2
  CSA_P0  : 5.78376e-02 ± 7.55564e-03
  CSA_P1  : 9.60065e-03 ± 5.69263e-04
  CSA_P2  : -4.60998e-05 ± 8.66920e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [11, 45, 66, 69, 80, 83, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [5, 30, 51, 60, 66, 75, 87, 97, 102, 120, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3927', '1.800', '0.1248', '1.800', '0.0954', '7.000', '0.7072', 1, 1, 1, 1, 1725517891.6754785]
VI_after__Init : ['1.202', '0.3928', '1.800', '0.1247', '1.800', '0.0896', '7.000', '0.7069', 1, 1, 1, 1, 1725517899.6818366]
VI_at__the_End : ['1.202', '0.4780', '1.800', '0.1347', '1.800', '0.1174', '7.000', '0.7076', 1, 1, 1, 1, 1725517966.7297285]