TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_29_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-003-016-01 | FUSED_ID : 6359364768394916097
  IC_TEMP :  -60.11 | VDDM : 1121.34 | AUX_INT :   -8.55 | CsaBias :   66.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20277e-03 / 2
  ADC_P0  : -8.55378e-03 ± 2.35139e-02
  ADC_P1  : 8.38394e-03 ± 5.82179e-04
  ADC_P2  : -5.37439e-06 ± 2.87120e-06
  CSA_Chi2/NDF : 1.88795e-04 / 2
  CSA_P0  : 5.78980e-02 ± 9.16470e-03
  CSA_P1  : 1.07309e-02 ± 6.90494e-04
  CSA_P2  : -6.17243e-05 ± 1.05154e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [44, 46, 77, 82, 105, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [25, 44, 45, 59, 61, 66, 93, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4493', '1.800', '0.1423', '1.800', '0.0988', '7.000', '0.7071', 1, 1, 1, 1, 1725517795.0510423]
VI_after__Init : ['1.202', '0.4502', '1.800', '0.1425', '1.800', '0.0927', '7.000', '0.7069', 1, 1, 1, 1, 1725517803.2002842]
VI_at__the_End : ['1.202', '0.4842', '1.800', '0.1377', '1.800', '0.1174', '7.000', '0.7077', 1, 1, 1, 1, 1725517868.794208]