TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_20_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-003-022-01 | FUSED_ID : 6359364768394916193
  IC_TEMP :  -71.63 | VDDM : 1119.35 | AUX_INT :   -8.32 | CsaBias :   54.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41936e-03 / 2
  ADC_P0  : -8.31816e-03 ± 2.55235e-02
  ADC_P1  : 8.96090e-03 ± 6.63894e-04
  ADC_P2  : -6.83178e-06 ± 3.43271e-06
  CSA_Chi2/NDF : 1.97610e-04 / 2
  CSA_P0  : 5.92755e-02 ± 9.37619e-03
  CSA_P1  : 1.08291e-02 ± 7.06428e-04
  CSA_P2  : -6.48096e-05 ± 1.07581e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [7, 21, 76, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [19, 46, 66, 82, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1551', '1.800', '0.0977', '1.800', '0.0870', '7.000', '0.7074', 1, 1, 1, 1, 1725517214.7818272]
VI_after__Init : ['1.202', '0.1551', '1.800', '0.0978', '1.799', '0.0815', '7.000', '0.7075', 1, 1, 1, 1, 1725517222.5132892]
VI_at__the_End : ['1.198', '0.4780', '1.800', '0.1377', '1.808', '0.1213', '7.000', '0.7080', 1, 1, 1, 1, 1725517290.1240366]