TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_46_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-004-006-14 | FUSED_ID : 6359364768394920046
  IC_TEMP :  -61.83 | VDDM : 1121.42 | AUX_INT :  -48.24 | CsaBias :   42.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.06041e-03 / 2
  ADC_P0  : -4.82424e-02 ± 3.30274e-02
  ADC_P1  : 9.13204e-03 ± 7.94996e-04
  ADC_P2  : -8.60355e-06 ± 3.79421e-06
  CSA_Chi2/NDF : 1.55201e-04 / 2
  CSA_P0  : 5.83741e-02 ± 8.30940e-03
  CSA_P1  : 1.00320e-02 ± 6.26053e-04
  CSA_P2  : -5.03181e-05 ± 9.53405e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [9, 38, 50, 67, 72, 76, 92, 95, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [30, 52, 57, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4178', '1.800', '0.1412', '1.800', '0.1047', '7.000', '0.7081', 1, 1, 1, 1, 1725518760.7114856]
VI_after__Init : ['1.202', '0.4179', '1.800', '0.1414', '1.800', '0.0971', '7.000', '0.7073', 1, 1, 1, 1, 1725518768.7399092]
VI_at__the_End : ['1.202', '0.4864', '1.800', '0.1368', '1.803', '0.1185', '7.000', '0.7079', 1, 1, 1, 1, 1725518835.2898378]