TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_52_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-004-010-14 | FUSED_ID : 6359364768394920110
  IC_TEMP :  -55.02 | VDDM : 1122.13 | AUX_INT :   -8.08 | CsaBias :   75.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45851e-03 / 2
  ADC_P0  : -8.07703e-03 ± 2.59322e-02
  ADC_P1  : 8.38933e-03 ± 6.47824e-04
  ADC_P2  : -5.08631e-06 ± 3.22540e-06
  CSA_Chi2/NDF : 1.19457e-04 / 2
  CSA_P0  : 5.98704e-02 ± 7.29000e-03
  CSA_P1  : 9.81860e-03 ± 5.49249e-04
  CSA_P2  : -4.61949e-05 ± 8.36442e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [11, 39, 56, 102, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [6, 44, 45, 65, 87, 101, 115, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4365', '1.800', '0.1385', '1.800', '0.0957', '7.000', '0.7075', 1, 1, 1, 1, 1725519141.6576147]
VI_after__Init : ['1.201', '0.4368', '1.800', '0.1385', '1.800', '0.0898', '7.000', '0.7076', 1, 1, 1, 1, 1725519149.7021224]
VI_at__the_End : ['1.202', '0.4913', '1.800', '0.1383', '1.800', '0.1140', '7.000', '0.7084', 1, 1, 1, 1, 1725519208.7256055]