TEST_NAME : Wafer
TEST_DATE : 24_09_05-08_55_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-004-012-14 | FUSED_ID : 6359364768394920142
  IC_TEMP :  -56.22 | VDDM : 1128.23 | AUX_INT :   -6.56 | CsaBias :   73.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.47898e-04 / 2
  ADC_P0  : -6.56128e-03 ± 1.97441e-02
  ADC_P1  : 8.08231e-03 ± 4.80883e-04
  ADC_P2  : -4.63322e-06 ± 2.32194e-06
  CSA_Chi2/NDF : 1.40644e-04 / 2
  CSA_P0  : 5.74648e-02 ± 7.91012e-03
  CSA_P1  : 1.00340e-02 ± 5.95970e-04
  CSA_P2  : -4.91908e-05 ± 9.07592e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [26, 27, 36, 53, 63, 76, 85, 101, 118, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [11, 17, 32, 43, 74, 81, 82]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3505', '1.800', '0.1212', '1.799', '0.0954', '7.000', '0.7076', 1, 1, 1, 1, 1725519334.007114]
VI_after__Init : ['1.202', '0.3507', '1.800', '0.1212', '1.799', '0.0895', '7.000', '0.7079', 1, 1, 1, 1, 1725519342.71846]
VI_at__the_End : ['1.202', '0.4897', '1.800', '0.1360', '1.800', '0.1142', '7.000', '0.7083', 1, 1, 1, 1, 1725519401.1230404]