TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_11_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-004-022-09 | FUSED_ID : 6359364768394920297
  IC_TEMP :  -55.01 | VDDM : 1126.98 | AUX_INT :   -7.37 | CsaBias :   76.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25310e-03 / 2
  ADC_P0  : -7.36649e-03 ± 2.39859e-02
  ADC_P1  : 8.39681e-03 ± 5.89988e-04
  ADC_P2  : -5.85809e-06 ± 2.87708e-06
  CSA_Chi2/NDF : 1.07331e-04 / 2
  CSA_P0  : 5.79365e-02 ± 6.91011e-03
  CSA_P1  : 9.45724e-03 ± 5.20627e-04
  CSA_P2  : -3.93067e-05 ± 7.92853e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [86, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [7, 11, 44, 70, 81, 97, 106, 108, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3291', '1.800', '0.1366', '1.799', '0.0923', '7.000', '0.7080', 1, 1, 1, 1, 1725520299.5486467]
VI_after__Init : ['1.202', '0.3294', '1.800', '0.1366', '1.800', '0.0866', '7.000', '0.7079', 1, 1, 1, 1, 1725520308.3789809]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1377', '1.800', '0.1106', '7.000', '0.7088', 1, 1, 1, 1, 1725520368.2412713]