TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_47_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-005-005-03 | FUSED_ID : 6359364768394924115
  IC_TEMP :  -56.55 | VDDM : 1127.52 | AUX_INT :   -7.79 | CsaBias :   75.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.55909e-04 / 2
  ADC_P0  : -7.78998e-03 ± 2.08793e-02
  ADC_P1  : 8.35588e-03 ± 5.03046e-04
  ADC_P2  : -6.38785e-06 ± 2.39507e-06
  CSA_Chi2/NDF : 1.11570e-04 / 2
  CSA_P0  : 5.73115e-02 ± 7.04523e-03
  CSA_P1  : 9.71168e-03 ± 5.30807e-04
  CSA_P2  : -4.37726e-05 ± 8.08356e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [11, 16, 25, 55, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 35, 96, 104, 110, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1902', '1.800', '0.1137', '1.800', '0.0889', '7.000', '0.7083', 1, 1, 1, 1, 1725522422.7127464]
VI_after__Init : ['1.202', '0.1903', '1.800', '0.1137', '1.800', '0.0814', '7.000', '0.7075', 1, 1, 1, 1, 1725522430.843021]
VI_at__the_End : ['1.201', '0.4917', '1.800', '0.1396', '1.800', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1725522496.3440175]