TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_43_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-005-007-03 | FUSED_ID : 6359364768394924147
  IC_TEMP :  -55.11 | VDDM : 1105.66 | AUX_INT :   -9.07 | CsaBias :   74.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36045e-03 / 2
  ADC_P0  : -9.07194e-03 ± 2.49733e-02
  ADC_P1  : 8.45496e-03 ± 6.10971e-04
  ADC_P2  : -6.23622e-06 ± 2.96550e-06
  CSA_Chi2/NDF : 1.10713e-04 / 2
  CSA_P0  : 5.79646e-02 ± 7.01813e-03
  CSA_P1  : 9.59832e-03 ± 5.28765e-04
  CSA_P2  : -4.21893e-05 ± 8.05247e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [3, 23, 24, 109, 117, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [20, 66, 83, 94, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1887', '1.800', '0.1716', '1.800', '0.0823', '7.000', '0.7073', 1, 1, 1, 1, 1725522230.544337]
VI_after__Init : ['1.202', '0.1886', '1.800', '0.1716', '1.800', '0.0769', '7.000', '0.7073', 1, 1, 1, 1, 1725522239.2967117]
VI_at__the_End : ['1.202', '0.4884', '1.800', '0.1407', '1.799', '0.1136', '7.000', '0.7083', 1, 1, 1, 1, 1725522307.5514007]