TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_40_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-005-009-03 | FUSED_ID : 6359364768394924179
  IC_TEMP :  -56.80 | VDDM : 1128.57 | AUX_INT :   -8.21 | CsaBias :   67.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09773e-03 / 2
  ADC_P0  : -8.20745e-03 ± 2.24302e-02
  ADC_P1  : 8.51507e-03 ± 5.60152e-04
  ADC_P2  : -5.94442e-06 ± 2.77740e-06
  CSA_Chi2/NDF : 1.67080e-04 / 2
  CSA_P0  : 5.95053e-02 ± 8.62152e-03
  CSA_P1  : 1.00568e-02 ± 6.49569e-04
  CSA_P2  : -5.06503e-05 ± 9.89217e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [15, 18, 34, 69, 70, 75, 92, 102, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [53, 98, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2499', '1.800', '0.1938', '1.799', '0.0961', '7.000', '0.7071', 1, 1, 1, 1, 1725522038.7620645]
VI_after__Init : ['1.201', '0.2502', '1.800', '0.1926', '1.801', '0.0907', '7.000', '0.7074', 1, 1, 1, 1, 1725522046.8314304]
VI_at__the_End : ['1.202', '0.4875', '1.800', '0.1378', '1.800', '0.1148', '7.000', '0.7080', 1, 1, 1, 1, 1725522114.951163]