TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_37_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-005-011-03 | FUSED_ID : 6359364768394924211
  IC_TEMP :  -50.98 | VDDM : 1129.51 | AUX_INT :  -72.74 | CsaBias :   19.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37165e-03 / 2
  ADC_P0  : -7.27358e-02 ± 2.86405e-02
  ADC_P1  : 9.27289e-03 ± 6.95369e-04
  ADC_P2  : -8.38605e-06 ± 3.32280e-06
  CSA_Chi2/NDF : 1.35281e-04 / 2
  CSA_P0  : 5.80644e-02 ± 7.75785e-03
  CSA_P1  : 9.86733e-03 ± 5.84498e-04
  CSA_P2  : -4.67136e-05 ± 8.90121e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [10, 26, 30, 51, 73, 78, 83, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 28, 33, 68, 69, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4452', '1.800', '0.1501', '1.799', '0.1017', '7.000', '0.7079', 1, 1, 1, 1, 1725521846.1418188]
VI_after__Init : ['1.201', '0.4458', '1.800', '0.1503', '1.802', '0.0947', '7.000', '0.7072', 1, 1, 1, 1, 1725521854.2431388]
VI_at__the_End : ['1.202', '0.4875', '1.800', '0.1387', '1.800', '0.1138', '7.000', '0.7079', 1, 1, 1, 1, 1725521920.241107]