TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_32_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-005-014-03 | FUSED_ID : 6359364768394924259
  IC_TEMP :  -53.58 | VDDM : 1113.48 | AUX_INT :   -8.69 | CsaBias :   60.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18010e-03 / 2
  ADC_P0  : -8.69318e-03 ± 2.32464e-02
  ADC_P1  : 8.72018e-03 ± 5.89634e-04
  ADC_P2  : -6.43991e-06 ± 2.97044e-06
  CSA_Chi2/NDF : 1.32871e-04 / 2
  CSA_P0  : 5.99033e-02 ± 7.68842e-03
  CSA_P1  : 1.00211e-02 ± 5.79267e-04
  CSA_P2  : -4.74346e-05 ± 8.82156e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 23, 27, 34, 49, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 34, 39, 55, 78, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1063', '1.800', '0.1575', '1.800', '0.0817', '7.000', '0.7066', 1, 1, 1, 1, 1725521555.7258139]
VI_after__Init : ['1.201', '0.1063', '1.800', '0.1575', '1.801', '0.0761', '7.000', '0.7069', 1, 1, 1, 1, 1725521563.936394]
VI_at__the_End : ['1.201', '0.4983', '1.800', '0.1391', '1.799', '0.1118', '7.000', '0.7076', 1, 1, 1, 1, 1725521630.1533349]