TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_30_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-005-015-03 | FUSED_ID : 6359364768394924275
  IC_TEMP :  -52.41 | VDDM : 1134.10 | AUX_INT :   -6.51 | CsaBias :   75.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.01554e-04 / 2
  ADC_P0  : -6.50827e-03 ± 2.03666e-02
  ADC_P1  : 8.21099e-03 ± 5.06385e-04
  ADC_P2  : -4.65122e-06 ± 2.49493e-06
  CSA_Chi2/NDF : 1.22736e-04 / 2
  CSA_P0  : 5.90898e-02 ± 7.38938e-03
  CSA_P1  : 1.00705e-02 ± 5.56736e-04
  CSA_P2  : -4.82266e-05 ± 8.47843e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [19, 54, 60, 79, 86, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [3, 38, 87, 104, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3456', '1.800', '0.1489', '1.800', '0.0952', '7.000', '0.7069', 1, 1, 1, 1, 1725521458.9454048]
VI_after__Init : ['1.200', '0.3456', '1.800', '0.1489', '1.801', '0.0894', '7.000', '0.7068', 1, 1, 1, 1, 1725521467.1967707]
VI_at__the_End : ['1.202', '0.4971', '1.800', '0.1400', '1.808', '0.1136', '7.000', '0.7074', 1, 1, 1, 1, 1725521525.9622316]