TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_18_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-005-023-04 | FUSED_ID : 6359364768394924404
  IC_TEMP :  -55.48 | VDDM : 1131.11 | AUX_INT :   -8.76 | CsaBias :   81.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26340e-03 / 2
  ADC_P0  : -8.76326e-03 ± 2.40832e-02
  ADC_P1  : 8.24736e-03 ± 5.82247e-04
  ADC_P2  : -5.49091e-06 ± 2.79844e-06
  CSA_Chi2/NDF : 1.44462e-04 / 2
  CSA_P0  : 5.66511e-02 ± 8.01677e-03
  CSA_P1  : 1.00948e-02 ± 6.04006e-04
  CSA_P2  : -4.86992e-05 ± 9.19830e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [1, 25, 35, 40, 60, 73, 84, 91, 95, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [6, 49, 51, 108, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3109', '1.800', '0.1517', '1.800', '0.0953', '7.000', '0.7077', 1, 1, 1, 1, 1725520685.412892]
VI_after__Init : ['1.202', '0.3108', '1.800', '0.1516', '1.800', '0.0894', '7.000', '0.7075', 1, 1, 1, 1, 1725520694.202261]
VI_at__the_End : ['1.202', '0.4943', '1.800', '0.1339', '1.799', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1725520761.558019]