TEST_NAME : Wafer
TEST_DATE : 24_09_05-09_54_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-006-006-13 | FUSED_ID : 6359364768394928237
  IC_TEMP :  -53.53 | VDDM : 1115.99 | AUX_INT :   -9.00 | CsaBias :   63.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46392e-03 / 2
  ADC_P0  : -9.00079e-03 ± 2.59454e-02
  ADC_P1  : 8.14830e-03 ± 6.18132e-04
  ADC_P2  : -5.47530e-06 ± 2.92339e-06
  CSA_Chi2/NDF : 1.07779e-04 / 2
  CSA_P0  : 6.01906e-02 ± 6.92450e-03
  CSA_P1  : 9.62534e-03 ± 5.21711e-04
  CSA_P2  : -4.33181e-05 ± 7.94504e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [18, 19, 27, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [16, 39, 40, 81, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2792', '1.800', '0.1365', '1.800', '0.0877', '7.000', '0.7078', 1, 1, 1, 1, 1725522898.8796914]
VI_after__Init : ['1.202', '0.2795', '1.800', '0.1365', '1.801', '0.0820', '7.000', '0.7075', 1, 1, 1, 1, 1725522907.0129983]
VI_at__the_End : ['1.201', '0.4911', '1.800', '0.1379', '1.809', '0.1156', '7.000', '0.7084', 1, 1, 1, 1, 1725522966.9661355]