TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_07_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-006-014-13 | FUSED_ID : 6359364768394928365
  IC_TEMP :  -52.93 | VDDM : 1119.63 | AUX_INT :   -9.37 | CsaBias :   74.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35801e-03 / 2
  ADC_P0  : -9.37141e-03 ± 2.49665e-02
  ADC_P1  : 8.42875e-03 ± 6.14750e-04
  ADC_P2  : -5.71525e-06 ± 3.01745e-06
  CSA_Chi2/NDF : 1.38932e-04 / 2
  CSA_P0  : 5.95836e-02 ± 7.86181e-03
  CSA_P1  : 1.01621e-02 ± 5.92331e-04
  CSA_P2  : -5.16068e-05 ± 9.02050e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [4, 42, 67, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [30, 36, 57, 69, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3913', '1.800', '0.1675', '1.800', '0.0925', '7.000', '0.7077', 1, 1, 1, 1, 1725523670.9349558]
VI_after__Init : ['1.202', '0.3915', '1.800', '0.1676', '1.801', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1725523679.895323]
VI_at__the_End : ['1.200', '0.4880', '1.800', '0.1409', '1.808', '0.1145', '7.000', '0.7084', 1, 1, 1, 1, 1725523739.2626605]