TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_11_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-006-016-10 | FUSED_ID : 6359364768394928394
  IC_TEMP :  -54.72 | VDDM : 1127.60 | AUX_INT :   -6.67 | CsaBias :   70.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.12043e-04 / 2
  ADC_P0  : -6.66913e-03 ± 2.04204e-02
  ADC_P1  : 8.62446e-03 ± 5.16142e-04
  ADC_P2  : -6.17899e-06 ± 2.58783e-06
  CSA_Chi2/NDF : 1.05890e-04 / 2
  CSA_P0  : 6.03616e-02 ± 6.86356e-03
  CSA_P1  : 9.74004e-03 ± 5.17120e-04
  CSA_P2  : -4.44822e-05 ± 7.87513e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 37, 40, 107, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [53, 64, 75, 80, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4173', '1.800', '0.1592', '1.799', '0.0967', '7.000', '0.7076', 1, 1, 1, 1, 1725523864.8968208]
VI_after__Init : ['1.202', '0.4175', '1.800', '0.1592', '1.801', '0.0908', '7.000', '0.7077', 1, 1, 1, 1, 1725523873.0022523]
VI_at__the_End : ['1.202', '0.4943', '1.800', '0.1394', '1.803', '0.1126', '7.000', '0.7084', 1, 1, 1, 1, 1725523932.9334571]