TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_14_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-006-018-10 | FUSED_ID : 6359364768394928426
  IC_TEMP :  -53.35 | VDDM : 1129.61 | AUX_INT :   -7.24 | CsaBias :   75.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06913e-03 / 2
  ADC_P0  : -7.24055e-03 ± 2.21287e-02
  ADC_P1  : 8.35237e-03 ± 5.41267e-04
  ADC_P2  : -5.74395e-06 ± 2.62969e-06
  CSA_Chi2/NDF : 1.08988e-04 / 2
  CSA_P0  : 6.01608e-02 ± 6.96326e-03
  CSA_P1  : 9.90682e-03 ± 5.24631e-04
  CSA_P2  : -4.65098e-05 ± 7.98951e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [24, 29, 40, 60, 63, 75, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 12, 54, 59, 94, 99, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3187', '1.800', '0.1224', '1.800', '0.0881', '7.000', '0.7074', 1, 1, 1, 1, 1725524058.2627528]
VI_after__Init : ['1.201', '0.3187', '1.800', '0.1223', '1.800', '0.0826', '7.000', '0.7076', 1, 1, 1, 1, 1725524066.38511]
VI_at__the_End : ['1.202', '0.4966', '1.800', '0.1394', '1.799', '0.1129', '7.000', '0.7080', 1, 1, 1, 1, 1725524134.181819]