TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_22_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-006-023-10 | FUSED_ID : 6359364768394928506
  IC_TEMP :  -52.73 | VDDM : 1127.49 | AUX_INT :   -8.62 | CsaBias :   76.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25515e-03 / 2
  ADC_P0  : -8.62220e-03 ± 2.40292e-02
  ADC_P1  : 8.52755e-03 ± 6.07570e-04
  ADC_P2  : -5.43451e-06 ± 3.05897e-06
  CSA_Chi2/NDF : 1.09041e-04 / 2
  CSA_P0  : 5.88627e-02 ± 6.96495e-03
  CSA_P1  : 1.01873e-02 ± 5.24759e-04
  CSA_P2  : -4.87750e-05 ± 7.99146e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [11]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [31, 38, 43, 56, 78, 84, 96, 102, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1904', '1.800', '0.1571', '1.799', '0.0887', '7.000', '0.7072', 1, 1, 1, 1, 1725524540.3402648]
VI_after__Init : ['1.202', '0.1904', '1.800', '0.1571', '1.800', '0.0836', '7.000', '0.7069', 1, 1, 1, 1, 1725524548.375625]
VI_at__the_End : ['1.202', '0.5034', '1.800', '0.1379', '1.800', '0.1106', '7.000', '0.7079', 1, 1, 1, 1, 1725524608.572952]