TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_23_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-006-024-10 | FUSED_ID : 6359364768394928522
  IC_TEMP :  -55.69 | VDDM : 1132.75 | AUX_INT :   -7.39 | CsaBias :   69.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.05228e-04 / 2
  ADC_P0  : -7.39185e-03 ± 1.91572e-02
  ADC_P1  : 8.59724e-03 ± 4.79832e-04
  ADC_P2  : -6.34430e-06 ± 2.38290e-06
  CSA_Chi2/NDF : 1.47630e-04 / 2
  CSA_P0  : 5.92362e-02 ± 8.10420e-03
  CSA_P1  : 1.02275e-02 ± 6.10593e-04
  CSA_P2  : -4.99070e-05 ± 9.29860e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [36, 47, 65, 87, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [2, 31, 45, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3959', '1.800', '0.1613', '1.799', '0.0929', '7.000', '0.7071', 1, 1, 1, 1, 1725524637.178029]
VI_after__Init : ['1.202', '0.3965', '1.800', '0.1614', '1.800', '0.0873', '7.000', '0.7070', 1, 1, 1, 1, 1725524645.9293964]
VI_at__the_End : ['1.202', '0.5012', '1.800', '0.1369', '1.802', '0.1121', '7.000', '0.7076', 1, 1, 1, 1, 1725524705.3631213]