TEST_NAME : Wafer
TEST_DATE : 24_09_05-10_25_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-006-025-10 | FUSED_ID : 6359364768394928538
  IC_TEMP :  -55.13 | VDDM : 1208.53 | AUX_INT : -975.20 | CsaBias : -686.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.29214e-02 / 2
  ADC_P0  : -9.75202e-01 ± 4.67275e-01
  ADC_P1  : 2.28986e-02 ± 8.92282e-03
  ADC_P2  : -5.58726e-05 ± 3.54363e-05
  CSA_Chi2/NDF : 1.19335e-04 / 2
  CSA_P0  : 5.82840e-02 ± 7.28628e-03
  CSA_P1  : 9.57834e-03 ± 5.48969e-04
  CSA_P2  : -4.05105e-05 ± 8.36014e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [7, 12, 41, 88, 93, 112, 115, 120, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [14, 29, 35, 72, 102, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1601', '1.800', '0.1638', '1.800', '0.0853', '7.000', '0.7070', 1, 1, 1, 1, 1725524733.7742715]
VI_after__Init : ['1.202', '0.1601', '1.800', '0.1638', '1.800', '0.0800', '7.000', '0.7069', 1, 1, 1, 1, 1725524741.844697]
VI_at__the_End : ['1.202', '0.4954', '1.800', '0.1379', '1.800', '0.1115', '7.000', '0.7075', 1, 1, 1, 1, 1725524801.6354265]